5‐3: Experimental and Physics‐Based Analysis of Leakage Currents for LTPS TFTs in AMOLED Displays

Author:

Kim Keunwoo1,Kim Hanbit1,Chu Jaehwan1,Thanh Tien Nguyen1,Lee Jaeseob1,Lee Dokyeong1,Kang Meejae1,Kim Doona1,Kim Sangsub1,Sung Bummo1,Kwak Hyena1,Lee Yongsu1,Kang Taewook1,Chu Hyeyong1,Lee Changhee1,Kwag Jinoh1

Affiliation:

1. Display Research Center Samsung Display Co., Ltd. Giheung-Gu Youngin-Si Gyeonggi-Do Korea

Publisher

Wiley

Reference18 articles.

1. Suppression of leakage current in solid-phase crystallization silicon thin-film transistor employing off-state-bias annealing;Park S.;Jpn. J. Appl. Phys.,2009

2. Multi-chip technologies to unleash computing performance gains over the next;Su L. T.;IEEE Int. Electron Devices Meeting (IEDM),2017

3. Improvement of hot carrier instability on small dimensional polycrystalline TFTs in flexible AMOLED displays;Kim K;Int. Meeting Inf. Dis. (IMID),2020

4. Gate-induced drain leakage current characteristics of p-type polycrystalline silicon thin film transistors aged by off-state stress

5. 16‐1: The role of hydrogen and surface potential in the performance and stability of poly‐Si TFTs on plastic substrates

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