Morphology and Thickness of Ultra-Thin Epitaxial Al2O3Film on Cu-9%Al(111)-Reference-Cited by-同舟云学术

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Morphology and Thickness of Ultra-Thin Epitaxial Al2O3Film on Cu-9%Al(111)

Published:2003-07-30 Issue:Part 1, No. 7B Volume:42 Page:4721-4724
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Yamauchi Yasuhiro,Yoshitake Michiko,Song Weijie

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/42/i=7S/a=4721/pdf

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Tool for Designing Breakthrough Discovery in Materials Science;Materials;2021-11-17

2. Structure of domain boundaries: binary oxides: Al2O3 films;Physics of Solid Surfaces;2018

3. Depth profiling of ultra-thin alumina layers grown on Co(0001);Journal of Physics: Condensed Matter;2013-01-18

4. Growth of Al2O3 Nanowires on the Cu-9 at.%Al(111) Single Crystal Surface;Journal of the American Ceramic Society;2011-07-19

5. Investigation of Cu–Al surface alloy formation on Cu substrate;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2010-03

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