Depth profiling of ultra-thin alumina layers grown on Co(0001)
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/25/i=9/a=095004/pdf
Reference39 articles.
1. Growth of thin, crystalline oxide, nitride and oxynitride films on metal and metal alloy surfaces
2. Surface studies of supported model catalysts
3. A photoelectron spectroscopy study of ultra-thin epitaxial alumina layers grown on Cu(111) surface
4. Growth of thin epitaxial alumina films onto Ni(111): an electron spectroscopy and diffraction study
5. Structure and defects of an ordered alumina film on NiAl(110)
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Reactive metal–oxide interfaces: A microscopic view;Surface Science Reports;2016-03
2. Novel method for the prediction of an interface bonding species at alumina/metal interfaces;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2014-03
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