A Phase Retrieval Method for Noncrystalline Layers on Crystal Surfaces-Reference-Cited by-同舟云学术

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A Phase Retrieval Method for Noncrystalline Layers on Crystal Surfaces

Published:2003-10-09 Issue:Part 1, No. 10 Volume:42 Page:6658-6662
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Yashiro Wataru,Sumitani Kazushi,Yoda Yoshitaka,Takahashi Toshio

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/42/i=10R/a=6658/pdf

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. In situ observation of x-ray irradiation effect by using a multiwave x-ray diffraction phenomenon;Journal of Applied Physics;2011-11-15

2. Theoretical description of the intensity of crystal-truncation-rod scattering modulated by a Bragg reflection;IOP Conference Series: Materials Science and Engineering;2011-09-19

3. Mesoscopic-Scale and Small Strain Field beneath SiO2/Si Interface Revealed by a Multiple-Wave X-ray Diffraction Phenomenon - Depth of the Strain Field;e-Journal of Surface Science and Nanotechnology;2011

4. Recent Progress in Solving the Phase Problem in Surface and Interface Crystallography;Transactions of the Materials Research Society of Japan;2008

5. Oxidation process dependence of strain field under the SiO2/Si(001) interface revealed by X-ray multiple-wave diffraction;Journal of Physics: Conference Series;2007-10-01

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