Quinhydrone/Methanol Treatment for the Measurement of Carrier Lifetime in Silicon Substrates-Reference-Cited by-同舟云学术

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Quinhydrone/Methanol Treatment for the Measurement of Carrier Lifetime in Silicon Substrates

Published:2002-08-01 Issue:Part 2, No. 8A Volume:41 Page:L870-L872
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Takato Hidetaka,Sakata Isao,Shimokawa Ryuichi

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/41/i=8A/a=L870/pdf

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