Investigation of dual intrinsic a-Si:H films for crystalline silicon surface passivation by spectroscopic ellipsometry: application in silicon heterojunction solar cells-Reference-Cited by-同舟云学术

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Investigation of dual intrinsic a-Si:H films for crystalline silicon surface passivation by spectroscopic ellipsometry: application in silicon heterojunction solar cells

Published:2023-07-26 Issue:8 Volume:129 Page:
ISSN:0947-8396
Container-title:Applied Physics A
language:en
Short-container-title:Appl. Phys. A

Author:

Pandey Ashutosh,Bhattacharya Shrestha,Panigrahi Jagannath,Mandal Sourav,Komarala Vamsi Krishna

Funder

Department of Science and Technology (DST), Government of India

DST INSPIRE Faculty award

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Link

https://link.springer.com/content/pdf/10.1007/s00339-023-06854-0.pdf

Reference34 articles.

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2. D. Adachi, J.L. Hernández, K. Yamamoto, Appl. Phys. Lett. 107, 233506 (2015)

3. A. Augusto, S.Y. Herasimenka, R.R. King, S.G. Bowden, C. Honsberg, J. Appl. Phys. 121, 205704 (2017)

4. H. Sai, P.W. Chen, H.J. Hsu, T. Matsui, S. Nunomura, K. Matsubara, J. Appl. Phys. 124, 103102 (2018)

5. W. Duan, A. Lambertz, K. Bittkau, D. Qiu, K. Qiu, U. Rau, K. Ding, Prog. Photovoltaics Res. Appl. 30, 384 (2022)

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