Barrier-Height Imaging of Si(001) 2 × n
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Interplay between tip-induced band bending and voltage-dependent surface corrugation on GaAs(110) surfaces;Physical Review B;2002-11-06
2. Scanning Tunneling Microscopy Barrier-Height Imaging of Shockley Dislocations on a Au(111) Reconstructed Surface;Japanese Journal of Applied Physics;2001-06-30
3. Barrier-height imaging of Cs-adsorbed Si(111);Applied Surface Science;2001-01
4. Tunneling barrier height at defect sites on Si(001);Surface Science;1999-11
5. References, metals on semiconductors;Adsorbed Layers on Surfaces. Part 1: Adsorption on Surfaces and Surface Diffusion of Adsorbates
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