Emissivity Compensation Utilizing Radiance Distribution in Thermal Images for Temperature Measurement of Electronic Devices
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Reference4 articles.
1. Thermal and Power Challenges in High Performance Computing Systems
2. In situSi Wafer Surface Temperature Measurement during Flash Lamp Annealing
3. An automatic emissivity-compensated radiation pyrometer
4. “Disappearing Object” Radiation Thermometer for Low-Emissivity Process Control
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1. Dual-wavelength reflectance-ratio method for emissivity-free temperature measurements applied to electromagnetically levitated liquid Ni;High Temperatures-High Pressures;2023
2. Emissivity-free radiation thermometry for high-temperature metals using the dual-wavelength reflectance-ratio method;Measurement Science and Technology;2022-10-20
3. Emissivity-free radiation thermometry based on multivariate analysis of spectral radiance applied to steel-making process;Measurement Science and Technology;2021-05-26
4. Toward Reliable Industrial Radiation Thermometry;International Journal of Thermophysics;2015-04-18
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