Growth and Electrical Characterization of N-face AlGaN/GaN Heterostructures-Reference-Cited by-同舟云学术

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Growth and Electrical Characterization of N-face AlGaN/GaN Heterostructures

Published:2005-11-25 Issue:No. 49 Volume:44 Page:L1478-L1480
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Rajan S.,Wong M.,Fu Y.,Wu F.,Speck J. S.,Mishra U. K.

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 80 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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