Characterization of Nickel-Silicide Dependence on the Substrate Dopants for Nanoscale Complementary Metal Oxide Semiconductor Technology-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Characterization of Nickel-Silicide Dependence on the Substrate Dopants for Nanoscale Complementary Metal Oxide Semiconductor Technology

Published:2004-01-13 Issue:1 Volume:43 Page:91-95
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Bae Mi-Suk,Ji Hee-Hwan,Lee Hun-Jin,Oh Soon-Young,Huang Bin-Feng,Yun Jang-Gn,Wang Jin-Suk,Park Seong-Hyung,Lee Hi-Deok

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/43/i=1R/a=91/pdf

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Process Considerations for selective doping of poly-Si thin films with spin-on dopants and nickel silicide formation for planar thermoelectric devices;Materials Science in Semiconductor Processing;2022-11

2. Etching Control of HfN Encapsulating Layer for PtHf-Silicide Formation with Dopant Segregation Process;IEICE Transactions on Electronics;2019-06-01

3. Texture characterization of the NiSi film on Si substrate;Microelectronic Engineering;2013-06

4. The influence of dopant species on thermal stability of NiSi film;Microelectronic Engineering;2011-05

5. Influence of Incorporating Rare Earth Metals on the Schottky Barrier Height of Ni Silicide;Japanese Journal of Applied Physics;2010-05-20

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP