Estimation of Schottky Contacts to Porous Si by Photoacoustic Spectroscopy-Reference-Cited by-同舟云学术

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Estimation of Schottky Contacts to Porous Si by Photoacoustic Spectroscopy

Published:2004-05-28 Issue:5B Volume:43 Page:2932-2935
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Kawahara Toshio,Funaki Shingo,Okamoto Masaki,Inoue Yoshihiro,Tahira Kenichiro,Okamoto Yoichi,Morimoto Jun

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigations of the optical absorption spectra of porous silicon layers on the Silicon backing by the nondestructive photoacoustic method;Thin Solid Films;2010-10

2. Photoacoustic investigations of the optical absorption spectra of porous silicon layers on a silicon backing;Solid State Communications;2010-03

3. Correlation between crystal growth and photosensitization of nanostructured TiO2 electrodes using supporting Ti substrates by self-assembled CdSe quantum dots;Thin Solid Films;2008-03

4. Application of the temperature distribution formula for the photoacoustic investigations of layer systems;The European Physical Journal Special Topics;2008-01

5. Crystal Growth of CdSe Quantum Dots Adsorbed on Nanoparticle, Inverse Opal, and Nanotube TiO2Photoelectrodes Characterized by Photoacoustic Spectroscopy;Japanese Journal of Applied Physics;2007-07-26

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