Photoacoustic investigations of the optical absorption spectra of porous silicon layers on a silicon backing
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,General Chemistry
Reference12 articles.
1. Characterization of the Oxidized .BETA.-Si3N4 Whisker Surface Layer Using XPS and TOF-SIMS.
2. Estimation of Schottky Contacts to Porous Si by Photoacoustic Spectroscopy
3. Characterization of thermal, optical and carrier transport properties of porous silicon using the photoacoustic technique
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