Reduction and Removal of Thin Al Oxide Film from Cu Substrate by Focused Electron Beam
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Enhancement of the electron-stimulated desorption from amorphous aluminum oxide films on silicon during an increase in the substrate temperature;Technical Physics;2012-05
2. Correlation between resistance-change effect in transition-metal oxides and secondary-electron contrast of scanning electron microscope images;Journal of Applied Physics;2011-09-15
3. Memory Retention Characteristics of Data Storage Area Written in Transition Metal Oxide Films by Using Atomic Force Microscope.;MRS Proceedings;2011
4. Surface study and thickness control of thin Al2O3 film on Cu–9%Al(111) single crystal;Applied Surface Science;2004-10
5. Morphology and Thickness of Ultra-Thin Epitaxial Al2O3Film on Cu-9%Al(111);Japanese Journal of Applied Physics;2003-07-30
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