New Method for Studying Surface and Interface Structures Using Kossel Lines
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Synchrotron X-ray Diffraction Studies of Nanoscale Thin Films and Wires;Nihon Kessho Gakkaishi;2013
2. X-ray divergent-beam (Kossel) technique: A review;Crystallography Reports;2011-03
3. Peculiar structure of X-ray standing wave lines of Si:As;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-01
4. New observation method for divergent beam X-ray diffraction patterns;J. Anal. At. Spectrom.;1999
5. Laue and Kossel Diffraction on Quasicrystals by Means of Synchrotron Radiation;Journal of Synchrotron Radiation;1998-03-01
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