Fabrication of Cantilever with Ultrasharp and High-Aspect-Ratio Stylus for Scanning Maxwell-Stress Microscopy-Reference-Cited by-同舟云学术

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Fabrication of Cantilever with Ultrasharp and High-Aspect-Ratio Stylus for Scanning Maxwell-Stress Microscopy

Published:1994-12-30 Issue:Part 1, No. 12B Volume:33 Page:7167-7170
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Itoh Junji,Tohma Yasushi,Inoue Takahito,Yokoyama Hiroshi,Shimizu Keizo

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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5. Surface potential imaging of organic and biological samples by using scanning Maxwell-stress microscopy (SMM);Scanning and Force Microscopies for Biomedical Applications;1999-06-17

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