Hard X-ray Photoemission Spectroscopy of Temperature-Induced Valence Transition in EuNi2(Si0.20Ge0.80)2-Reference-Cited by-同舟云学术

Hard X-ray Photoemission Spectroscopy of Temperature-Induced Valence Transition in EuNi2(Si0.20Ge0.80)2

Published:2004-10-15 Issue:10 Volume:73 Page:2616-2619
ISSN:0031-9015
Container-title:Journal of the Physical Society of Japan
language:en
Short-container-title:J. Phys. Soc. Jpn.

Author:

Yamamoto Kazuya¹²,Taguchi Munetaka²,Kamakura Nozomu²,Horiba Koji²,Takata Yasutaka²,Chainani Ashish²,Shin Shik²³,Ikenaga Eiji⁴,Mimura Kojiro¹,Shiga Masayuki⁵,Wada Hirofumi⁵,Namatame Hirofumi⁶,Taniguchi Masaki⁶,Awaji Mitsuhiro⁴,Takeuchi Akihisa⁴,Nishino Yoshinori²,Miwa Daigo²,Ishikawa Tetsuya²,Kobayashi Keisuke⁴

Affiliation:

1. Graduate School of Engineering, Osaka Prefecture University, Sakai, Osaka 599-8531

2. RIKEN/SPring-8, Mikazuki-cho, Sayo-gun, Hyogo 679-5148

3. The Institute for Solid State Physics, The University of Tokyo, Kashiwa, Chiba 277-8581

4. JASRI/SPring-8, Mikazuki-cho, Sayo-gun, Hyogo 679-5148

5. Department of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501

6. Hiroshima Syncrotron Radiation Center, Hiroshima University, Higashi-Hiroshima, Hiroshima 739-8526

Publisher

Physical Society of Japan

Subject

General Physics and Astronomy

Link

http://journals.jps.jp/doi/pdf/10.1143/JPSJ.73.2616

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