Temperature-Induced Valence Transition of EuPd2Si2Studied by Hard X-ray Photoelectron Spectroscopy-Reference-Cited by-同舟云学术

Temperature-Induced Valence Transition of EuPd2Si2Studied by Hard X-ray Photoelectron Spectroscopy

Published:2011-05-01 Issue:5S2 Volume:50 Page:05FD03
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Mimura Kojiro,Uozumi Takayuki,Ishizu Takahiko,Motonami Satoru,Sato Hitoshi,Utsumi Yuki,Ueda Shigenori,Mitsuda Akihiro,Shimada Kenya,Taguchi Yukihiro,Yamashita Yoshiyuki,Yoshikawa Hideki,Namatame Hirofumi,Taniguchi Masaki,Kobayashi Keisuke

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Reference10 articles.

1. A new and unique Eu-based mixed valence system: EuPd2Si2

2. Mössbauer effects and LIII absorption measurements on EuPd2Si2

3. Combined Mössbauer and LIII-edge X-ray absorption study of mixed- valent EuPd2Si2 and EuNi2P2

4. First-Order Valence Transition of EuPd2Si2Induced by High Magnetic Fields

5. Field-induced valence transition of Eu(Pd1−xPtx)2Si2

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