Characteristics of the Tokyo Electron-Beam Ion Trap-Reference-Cited by-同舟云学术

Characteristics of the Tokyo Electron-Beam Ion Trap

Published:1997-12-15 Issue:12 Volume:66 Page:3795-3800
ISSN:0031-9015
Container-title:Journal of the Physical Society of Japan
language:en
Short-container-title:J. Phys. Soc. Jpn.

Author:

Watanabe Hirofumi¹²,Asada Junji²,Currell Frederick John²,Fukami Tsunemitsu²,Hirayama Takato³,Motohashi Kenji⁴,Nakamura Nobuyuki⁵,Nojikawa Eimitsu⁵,Ohtani Shunsuke²⁵,Okazaki Kiyohiko⁶,Sakurai Makoto⁷,Shimizu Hiroshi²,Tada Naoko⁵,Tsurubuchi Seiji⁴

Affiliation:

1. Kyoto University Faculty of Engineering, Kyoto, Kyoto 606-01

2. University of Electro-Communications Institute for Laser Science, Chofu, Tokyo 182

3. Gakushuin University Faculty of Science, Toshima, Tokyo 171

4. Tokyo University of Agriculture and Technology Faculty of Technology, Koganei, Tokyo 184

5. Japan Science and Technology Corporation, Chofu, Tokyo 182

6. Institute of Physical and Chemical Research (Riken), Wako, Saitama 351

7. Institute for Molecular Science, Okazaki, Aichi 444

Publisher

Physical Society of Japan

Subject

General Physics and Astronomy

Link

http://journals.jps.jp/doi/pdf/10.1143/JPSJ.66.3795

Cited by 59 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A compact electron beam ion trap in support of high-temperature plasma diagnostics based on conduction-cooled superconducting coils;Review of Scientific Instruments;2021-06-01

2. An application of a Si/CdTe Compton camera for the polarization measurement of hard x rays from highly charged heavy ions;Review of Scientific Instruments;2021-06-01

3. Effect of generalized Breit interaction in dielectronicrecombination for highly charged ions;Journal of Physics B: Atomic, Molecular and Optical Physics;2015-07-17

4. Characteristics of x-ray emission from optically thin high-Zplasmas in the soft x-ray region;Journal of Physics B: Atomic, Molecular and Optical Physics;2015-05-28

5. Spectroscopic study of bismuth ions with an electron beam ion trap;Journal of Physics: Conference Series;2014-04-10