An application of a Si/CdTe Compton camera for the polarization measurement of hard x rays from highly charged heavy ions

Author:

Tsuzuki Yutaka12ORCID,Watanabe Shin23,Oishi Shimpei4,Nakamura Nobuyuki4,Numadate Naoki45,Odaka Hirokazu12,Uchida Yuusuke6,Yoneda Hiroki7ORCID,Takahashi Tadayuki12

Affiliation:

1. Department of Physics, The University of Tokyo, 7-3-1, Hongo, Bunkyo, Tokyo 113-0033, Japan

2. Kavli Institute for the Physics and Mathematics of the Universe (WPI), Institutes for Advanced Study (UTIAS), The University of Tokyo, 5-1-5 Kashiwa-no-Ha, Kashiwa, Chiba 277-8583, Japan

3. Institute of Space and Astronautical Science, Japan Aerospace Exploration Agency, 3-1-1 Yoshinodai, Chuo Sagamihara, Kanagawa 252-5210, Japan

4. Institute for Laser Science, The University of Electro-Communications, Chofu, Tokyo 182-8585, Japan

5. Komaba Institute for Science, The University of Tokyo, 3-8-1 Komaba, Meguro, Tokyo 153-8902, Japan

6. Department of Physics, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima, Hiroshima 739-8526, Japan

7. RIKEN Nishina Center, 2-1 Hirosawa, Wako, Saitama 351-0198, Japan

Funder

Japan Society for the Promotion of Science

Publisher

AIP Publishing

Subject

Instrumentation

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