Characterization of the Initial Rapid Decay on Light-Induced Carrier Lifetime and Cell Performance Degradation of Czochralski-Grown Silicon
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://stacks.iop.org/1347-4065/42/i=5R/a=2564/pdf
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3. Fast and Slow Stages of Lifetime Degradation by Boron–Oxygen Centers in Crystalline Silicon;physica status solidi (b);2019-08-25
4. Impact of interstitial iron on the study of meta-stable B-O defects in Czochralski silicon: Further evidence of a single defect;Journal of Applied Physics;2018-04-28
5. Recent insights into boron-oxygen related degradation: Evidence of a single defect;Solar Energy Materials and Solar Cells;2017-12
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