The Electrical Characteristics of Metal-Oxide-Semiconductor Field Effect Transistors Fabricated on Cubic Silicon Carbide-Reference-Cited by-同舟云学术

The Electrical Characteristics of Metal-Oxide-Semiconductor Field Effect Transistors Fabricated on Cubic Silicon Carbide

Published:2003-06-15 Issue:Part 2, No. 6B Volume:42 Page:L625-L627
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Ohshima Takeshi,Lee Kin Kiong,Ishida Yuuki,Kojima Kazutoshi,Tanaka Yasunori,Takahashi Tetsuo,Yoshikawa Masahito,Okumura Hajime,Arai Kazuo,Kamiya Tomihiro

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/42/i=6B/a=L625/pdf

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