Activation of B and As in Ultrashallow Junction During Millisecond Annealing Induced by Thermal Plasma Jet Irradiation
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Reference16 articles.
1. Decaborane implantation with the medium current implanter
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1. High-efficiency impurity activation by precise control of cooling rate during atmospheric pressure thermal plasma jet annealing of 4H-SiC wafer;Japanese Journal of Applied Physics;2015-05-27
2. Improvement in Characteristic Variability of TFTs Using Grain Growth Control by Micro Thermal Plasma Jet Irradiation on a-Si Strips;Journal of Display Technology;2014-11
3. Effect of Grain Growth Control by Atmospheric Micro-Thermal- Plasma-Jet Crystallization of Amorphous Silicon Strips on TFT Characteristics;ECS Transactions;2014-08-05
4. Annealing performance improvement of elongated inductively coupled plasma torch and its application to recovery of plasma-induced Si substrate damage;Japanese Journal of Applied Physics;2014-01-01
5. Simultaneous Formation of a Metallic Mn Layer and a MnOx/MnSixOyBarrier Layer by Chemical Vapor Deposition at 250 °C;Japanese Journal of Applied Physics;2013-05-01
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