High-Resolution Electron Microscopy of the High-TcSuperconductor Bi-Ca-Sr-Cu-O-Reference-Cited by-同舟云学术

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High-Resolution Electron Microscopy of the High-TcSuperconductor Bi-Ca-Sr-Cu-O

Published:1988-04-20 Issue:Part 2, No. 4 Volume:27 Page:L573-L576
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Hiraga Kenji,Hirabayashi Makoto,Kikuchi Masae,Syono Yasuhiko

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 71 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Crystal structures of copper oxide-based perovskite compounds;Perovskite Ceramics;2023

2. Quantitative phase analysis of Bi2Sr2CaCu2O8+x and competing intergrowth and co-crystallizing phases via a Rietveld refinement study;Journal of Applied Crystallography;2021-07-29

3. High-resolution electron microscopy and electron diffraction of perovskite-type superconducting copper oxides;Nanotechnology Reviews;2014-01-01

4. Quasicrystal-like structure and its crystalline approximant in an Fe48Cr15Mo14C15B6Tm2 bulk metallic glass;Journal of Alloys and Compounds;2010-08

5. Order, disorder and structural modulations in Bi–Fe–W–O–Br Sillén–Aurivillius intergrowths;Acta Crystallographica Section B Structural Science;2008-07-17

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