Growth and Surface Morphology of Textured NiO Thin Films Deposited by Off-Axis RF Magnetron Sputtering-Reference-Cited by-同舟云学术

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Growth and Surface Morphology of Textured NiO Thin Films Deposited by Off-Axis RF Magnetron Sputtering

Published:2004-08-10 Issue:8A Volume:43 Page:5524-5525
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Ryu Hyun-Wook,Choi Gwang-Pyo,Hong Gwang-Jun,Park Jin-Seong

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 35 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Physically‐Deposited Hole Transporters in Perovskite PV: NiO_x Improved with Li/Mg Doping;Advanced Materials Technologies;2024-02-15

2. The influence of substrate temperature on the structure and optical properties of NiO thin films deposited using the magnetron sputtering in the layer-by-layer growth regime;Semiconductor Physics, Quantum Electronics and Optoelectronics;2023-12-05

3. Growth of NiO Thin Films in the Presence of Water Vapor: Insights from Experiments and Theory;The Journal of Physical Chemistry C;2023-11-02

4. Pure ultraviolet light-emitting diode based on the p-NiO/i-NiO/n-GaN structure by magnetron sputtering;Optical Materials;2023-11

5. Origin of Surface Reduction upon Water Adsorption on Oriented NiO Thin Films and Its Relation to Electrochemical Activity;The Journal of Physical Chemistry C;2022-01-18

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