Effect of Interface Layers on Phase-Change Recording Material Analyzed by Hard X-ray Photoelectron Spectroscopy Method
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
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1. Hard X-ray Photoemission Spectroscopy at Two Public Beamlines of SPring-8: Current Status and Ongoing Developments;Synchrotron Radiation News;2018-07-04
2. Development of high lateral and wide angle resolved hard X-ray photoemission spectroscopy at BL47XU in SPring-8;Journal of Electron Spectroscopy and Related Phenomena;2013-10
3. Band offsets between SiO2 and phase change materials in the (GeTe)x(Sb2Te3)1−x pseudobinary system;Applied Physics Letters;2011-03-28
4. Chemical states of Bi-doped GeTe (Bi: 6 at.%) thin film in structural phase transition investigated by synchrotron X-ray photoelectron spectroscopy;Current Applied Physics;2010-09
5. Hard X-ray photoemission spectroscopy;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2009-03
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