Noise Reduction of Microwave Dielectric Map using Fourier Analysis Refinement-Reference-Cited by-同舟云学术

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Noise Reduction of Microwave Dielectric Map using Fourier Analysis Refinement

Published:2007-10-22 Issue:10B Volume:46 Page:7097-7100
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Kakemoto Hirofumi,Harigai Takakiyo,Li Jianyong,Nam Song-Min,Wada Satoshi,Tsurumi Takaaki

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Reference7 articles.

1. The measurement of the properties of materials

2. dc-Electrical Degradation of the BT-Based Material for Multilayer Ceramic Capacitor with Ni internal Electrode: Impedance Analysis and Microstructure

3. Super-resolution Aperture Scanning Microscope

4. Scanning tip microwave near‐field microscope

5. Quantitative microwave near-field microscopy of dielectric properties

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effect of bottom electrode structure on electrical properties of BaTiO3 thin films fabricated by CSD method;Journal of the Ceramic Society of Japan;2010

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