Effects of Relativistic Frequency Down-Shift and Optical Thickness on Measurements of Electron Temperature Profile from Electron Cyclotron Emission in Medium Temperature Tokamak Plasmas-Reference-Cited by-同舟云学术

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Effects of Relativistic Frequency Down-Shift and Optical Thickness on Measurements of Electron Temperature Profile from Electron Cyclotron Emission in Medium Temperature Tokamak Plasmas

Published:1998-09-15 Issue:9 Volume:67 Page:3090-3099
ISSN:0031-9015
Container-title:Journal of the Physical Society of Japan
language:en
Short-container-title:J. Phys. Soc. Jpn.

Author:

Sato Masayasu¹,Isei Nobuaki¹,Ishida Shinichi¹,Isayama Akihiko¹

Affiliation:

1. Japan Atomic Energy Research Institute, Tokai-mura, Naka-gun, Ibaraki, 319-1195

Publisher

Physical Society of Japan

Subject

General Physics and Astronomy

Link

http://journals.jps.jp/doi/pdf/10.1143/JPSJ.67.3090

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2. Design of the electron cyclotron emission diagnostic on EXL-50 spherical torus;Plasma Science and Technology;2023-11-16

3. Conceptual design of electron cyclotron emission diagnostic for Chinese Fusion Engineering Testing Reactor;Fusion Engineering and Design;2021-03

4. Analysis of electron cyclotron emission with extended electron cyclotron forward modeling;Plasma Physics and Controlled Fusion;2018-09-07

5. The effects of relativistic broadening and frequency down-shift on electron—cyclotron emission measurements in EAST;Chinese Physics B;2012-04

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