Determination of the Photocarrier Lifetime in Amorphous Silicon with the Moving Photocarrier Grating Technique
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
https://iopscience.iop.org/article/10.1143/JJAP.33.L1809/pdf
Reference11 articles.
1. Steady‐state photocarrier grating technique for diffusion length measurement in photoconductive insulators
2. Ambipolar transport in amorphous semiconductors in the lifetime and relaxation-time regimes investigated by the steady-state photocarrier grating technique
3. Theory of the steady-state-photocarrier-grating technique for obtaining accurate diffusion-length measurements in amorphous silicon
4. Modulated photocarrier grating technique for diffusion length measurement in amorphous semiconductors
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. The chopped moving photocarrier grating technique;Review of Scientific Instruments;2019-12-01
2. Bipolar treatment of the electrically detected photocarrier grating method;Applied Physics Letters;1995-10-23
3. Analysis of the moving-photocarrier-grating technique for the determination of mobility and lifetime of photocarriers in semiconductors;Physical Review B;1995-04-15
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