New On-Chip De-Embedding for Accurate Evaluation of Symmetric Devices

Author:

Goto Yosuke,Natsukari Youhei,Fujishima Minoru

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 15 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Modified Bisection Thru-Only Deembedding Algorithm for Long Test Fixtures;2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS);2024-04-15

2. Investigation of de-embedding techniques applied on uni-traveling carrier photodiodes;International Journal of Microwave and Wireless Technologies;2021-03-10

3. Analysis of the parameter extraction for on-chip transmission lines;IEICE Electronics Express;2020-09-25

4. A de‐embedding method with matrix rectification and influences of residual errors on model parameters extraction of InP HEMTs;International Journal of RF and Microwave Computer-Aided Engineering;2020-03-26

5. Half-Thru de-embedding method for millimeter-wave and sub-millimeter-wave integrated circuits;2014 10th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME);2014-06

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