Electron-Beam Detection of Bits Reversibly Recorded on Epitaxial InSe/GaSe/Si Phase-Change Diodes-Reference-Cited by-同舟云学术

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Electron-Beam Detection of Bits Reversibly Recorded on Epitaxial InSe/GaSe/Si Phase-Change Diodes

Published:2006-04-07 Issue:4A Volume:45 Page:2580-2592
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Chaiken Alison,Gibson Gary A.,Chen John,Yeh Bao S.,Jasinski J. B.,Liliental-Weber Z.,Nauka K.,Yang C. C.,Lindig D. D.,Subramanian S.

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

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