Progress in Spin-on Hard Mask Materials for Advanced Lithography

Author:

Padmanaban Munirathna,Cho JoonYeon,Kudo Takanori,Rahman Dalil,Yao Huirong,McKenzie Douglas,Dioses Alberto,Mullen Salem,Wolfer Elizabeth,Yamamoto Kazuma,Cao Yi,Her YoungJun

Publisher

Technical Association of Photopolymers, Japan

Subject

Materials Chemistry,Organic Chemistry,Polymers and Plastics

Cited by 25 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Wafer Edge Protection Layer: A Solution for Metal Contamination Issue in Advanced Patterning Process;Journal of Photopolymer Science and Technology;2024-06-25

2. Selective Atomic Layer Etching for Silicon Device Fabrication;2024 International Conference on Integrated Circuits, Communication, and Computing Systems (ICIC3S);2024-06-08

3. Development of wafer edge protection layer for advanced patterning process;Advances in Patterning Materials and Processes XLI;2024-04-09

4. High-Density Nanopatterning of SiGeAsTe Chalcogenide as Ovonic Threshold Switch Selectors for Memory Applications;ACS Applied Nano Materials;2023-06-03

5. Chitosan as a water-based photoresist for DUV lithography;Advances in Patterning Materials and Processes XL;2023-05-01

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