Author:
Binns Martin J,Kearns Joel,Good Ethan A
Abstract
Although N-type CZ material exhibits a high initial lifetime ideally suited to the fabrication of high efficiency solar cells, degradation of wafer lifetime during processing leading to a decrease in cell efficiency can occur due to the growth of pre-existing small oxygen clusters. The mechanism for lifetime degradation associated with oxygen defects is discussed. Lifetime degradation can be avoided and high cell efficiencies achieved by using wafers with a lower initial oxygen concentration.
Publisher
The Electrochemical Society
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献