In Situ Characterization of Anodic Silicon Oxide Films by AC Impedance Measurements-Reference-Cited by-同舟云学术

In Situ Characterization of Anodic Silicon Oxide Films by AC Impedance Measurements

Published:1995-05-01 Issue:5 Volume:142 Page:1705-1712
ISSN:0013-4651
Container-title:Journal of The Electrochemical Society
language:
Short-container-title:J. Electrochem. Soc.

Author:

Schmuki P.¹²,Böhni H.¹²,Bardwell J. A.¹²

Affiliation:

1. Institute of Materials Chemistry and Corrosion, Swiss Federal Institute of Technology, ETH‐Hönggerberg, CH‐8093 Zürich, Switzerland

2. Institute for Microstructural Sciences, National Research Council of Canada, Ottawa, Ontario, Canada K1A 0R6

Publisher

The Electrochemical Society

Subject

Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

https://iopscience.iop.org/article/10.1149/1.2048644/pdf

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