Author:
Batude Perrine,Vinet Maud,Pouydebasque Arnaud,Clavelier Laurent,LeRoyer Cyrille,Tabone Claude,Previtali Bernard,Sanchez Loic,Baud Laurence,Roman Antonio,Carron Véronique,Nemouchi Fabrice,Pocas Stéphane,Comboroure Corine,Mazzocchi Vincent,Grampeix Helen,Aussenac François,Deleonibus Simon
Abstract
3D monolithic integration, thanks to its high vertical density of interconnections, is the only available option for applications requiring connections at the transistor scale. However to achieve 3D monolithic integration, some issues such as realization of high quality top film, high stability bottom FET, low thermal budget top FET still have to be solved. In this work, a 3D monolithic process flow relying on molecular wafer bonding is proposed and results in all critical steps are given. Significant breakthroughs have been obtained using a full wafer molecular bonding with thin interlayer dielectric and an original salicidation process stabilized up to 650oC enabling to reach high performance for the top and bottom transistor.
Publisher
The Electrochemical Society
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献