Author:
Nakamura Takashi,Aketa Masatoshi,Nakano Yuki,Otake Hirotaka,Otsuka Takukazu,Hanada Toshio
Abstract
SiC devices have the potential to reduce energy losses in high power applications. However SiC devices have yet to achieve ideal performance levels. This paper presents SiC diodes and MOSFETs with advanced trench structures. These devices succeeded in improving performance by reduction of the internal electric field. Trench Schottky diodes are able to reduce forward voltage drop and double-trench MOSFETs show extremely low on-resistance.
Publisher
The Electrochemical Society
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献