Author:
Au Yeung,Lin Youbo,Kim Hoon,Beh Eugene,Liu Yiqun,Gordon Roy G.
Publisher
The Electrochemical Society
Subject
Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials
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4. Electromigration of Cu/low dielectric constant interconnects
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