Atomic Layer Etching of Si(100) and Si(111) Using Cl[sub 2] and Ar Neutral Beam

Author:

Park S. D.,Lee D. H.,Yeom G. Y.

Publisher

The Electrochemical Society

Subject

Electrical and Electronic Engineering,Electrochemistry,Physical and Theoretical Chemistry,General Materials Science,General Chemical Engineering

Cited by 49 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Plasma application in atomic layer etching;Physics of Plasmas;2023-08-01

2. Near-surface damage and mixing in Si-Cl2-Ar atomic layer etching processes: Insights from molecular dynamics simulations;Journal of Vacuum Science & Technology A;2023-06-15

3. Measuring Ion Energy Distributions by Retarding Field Energy Analyzer and Using Low-Energy Ions for Si-ALE by Cl2;2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM);2023-05

4. Brief Review of Atomic Layer Etching Based on Radiofrequency-Biased Ar/C4F6-Mixture-Based Inductively Coupled Plasma Characteristics;Applied Science and Convergence Technology;2023-03-30

5. Pulsed laser induced atomic layer etching of silicon;Journal of Vacuum Science & Technology A;2023-03

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