Author:
Tomioka Katsuhiro,Fukui Takashi
Abstract
We report on vertical tunnel field-effect transistors (TFETs) using III-V nanowire (NW)/Si heterojunctions. III-V nanowire (NW) was heterogeneously integrated on Si by selective-area growth with precise positioning. The III-V NW/Si heterojunction consisting of a few misfit dislocations shows a large Zener tunnel current under positive bias and band-to-band tunneling current under forward bias. The vertical TFET using InGaAs NW/Si heterojunction, which is vertical surrounding-gate architecture, demonstrated a steep turn-on behavior and very low parasitic leakage current.
Publisher
The Electrochemical Society
Cited by
1 articles.
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