The effect of Ga pre-deposition on Si (111) surface for InAs nanowire selective area hetero-epitaxy

Author:

Liu Ziyang12,Merckling Clement1,Rooyackers Rita1,Franquet Alexis1,Richard Olivier1,Bender Hugo1,Vila María34ORCID,Rubio-Zuazo Juan34,Castro Germán R.34,Collaert Nadine1,Thean Aaron1,Vandervorst Wilfried15,Heyns Marc12

Affiliation:

1. imec, Kapeldreef 75, 3001 Leuven, Belgium

2. Department of Materials Engineering, KULeuven, 3001 Leuven, Belgium

3. SpLine CRG BM25 Beamline, European Synchrotron Radiation Facility, 71, Avenue des Martys, 38000 Grenoble, France

4. Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Científicas (ICMM-CSIC), 28049 Madrid, Spain

5. Department of Physics and Astronomy, KULeuven, 3001 Leuven, Belgium

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Reference42 articles.

1. Size-Dependent-Transport Study of $\hbox{In}_{0.53} \hbox{Ga}_{0.47}\hbox{As}$ Gate-All-Around Nanowire MOSFETs: Impact of Quantum Confinement and Volume Inversion

2. A III–V nanowire channel on silicon for high-performance vertical transistors

3. Vertical Enhancement-Mode InAs Nanowire Field-Effect Transistor With 50-nm Wrap Gate

4. S. Ramesh , T. Ivanov , E. Camerotto , N. Sun , J. Franco , A. Sibaja-Hernandez , R. Rooyackers , A. Alian , J. Loo , A. Veloso , A. Milenin , D. Lin , P. Favia , H. Bender , N. Collaert , A. V. Y. Thean , and K. De Meyer , in Proceedings of the Symposium on VLSI Technology (2016), pp. 164–165.

5. Nanometer-Scale Vertical-Sidewall Reactive Ion Etching of InGaAs for 3-D III-V MOSFETs

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3