Li-Ion-Trapping-Induced Degradation Mechanism of Colored State in Tungsten Oxide Electrochromic Films

Abstract

Aiming to investigate the degradation mechanism of their colored states, tungsten oxide films with different oxygen/tungsten ratio were prepared by direct current reactive magnetron sputtering through adjusting the oxygen partial pressure. After a long-term cycling test, the sample prepared under low oxygen partial pressure (LO#) showed an excellent cycle stability which its optical modulation amplitude remains stable at 23.6%, while the one prepared under high oxygen partial pressure (HO#) exhibited an obvious degradation process of the colored state, leading to the optical modulation amplitude decreased from 34.0% to 18.6% accompanied with a decay of ionic diffusion coefficient and electrode potential, but having an improved coloration efficiency. Combined with various structural characterizations, including SEM, LA-ICP-MS, Raman and XPS, we demonstrate such colored state degradation is attributed to the so-called shallow trap, which corresponds to the irreversible and non-coloring reaction with interstitial oxygen during the insertion of Li+ cations forming superoxides (e.g. LiO2). All these findings not only offer a new insight into the improvement of cyclic stability based on ion-exchange, but also provide a valued information to understanding the physicochemical mechanisms of degradation in electrochromic materials.