Author:
Niu G.,Zhang Huaiyuan,Li Yiao,Ding Xuewei,Willemsen Marnix,Scholten Andries
Publisher
The Electrochemical Society
Cited by
1 articles.
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1. Physics, Characterization and Modeling of RF Linearity in SiGe HBT and FinFET Technologies;2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS);2022-10-16