Author:
Voronkov V. V.,Falster R.
Publisher
The Electrochemical Society
Subject
Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials
Reference46 articles.
1. The mechanism of swirl defects formation in silicon
2. Vacancy-type microdefect formation in Czochralski silicon
3. V. V. Voronkov, R. Falster, and J. C. Holzer, inCrystalline Defects and Contamination: Their Impact and Control in Device Manufacturing II, B. O. Kolbeson, P. Stallhofer, C. Claeys, and F. Tardiff, Editors, PV 97-22, p. 2, The Electrochemical Society Proceedings Series, Pennington, NJ (1997).
4. The effect of thermal history during crystal growth on oxygen precipitation in Czochralski-grown silicon
5. The Direct Observation of Grown‐in Laser Scattering Tomography Defects in Czochralski Silicon
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