Investigation of noise in surface topography measurement using structured illumination microscopy
Author:
Affiliation:
1. Chemnitz University of Technology, Department of Production Measuring Technology, Reichenhainer Straße 70, 09126 Chemnitz, Germany
Publisher
Polish Academy of Sciences Chancellery
Link
https://journals.pan.pl/Content/121804/PDF/art11_final.pdf
Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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