Sparse domain robust denoising method in optically-sectioned structured illumination microscopy for complex surface measurement
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Published:2024-09
Issue:
Volume:180
Page:108338
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ISSN:0143-8166
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Container-title:Optics and Lasers in Engineering
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language:en
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Short-container-title:Optics and Lasers in Engineering
Author:
Chai ChangchunORCID,
Chen ChengORCID,
Qu Tong,
Liu Xiaojun
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