Light Effects on the Bias Stability of Transparent ZnO Thin Film Transistors-Reference-Cited by-同舟云学术

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Light Effects on the Bias Stability of Transparent ZnO Thin Film Transistors

Published:2009-02-05 Issue:1 Volume:31 Page:62-64
ISSN:1225-6463
Container-title:ETRI Journal
language:en
Short-container-title:ETRI Journal

Author:

Shin Jae-Heon,Lee Ji-Su,Hwang Chi-Sun,Park Sang-Hee Ko,Cheong Woo-Seok,Ryu Minki,Byun Chun-Won,Lee Jeong-Ik,Chu Hye Yong

Publisher

Wiley

Subject

Electrical and Electronic Engineering,General Computer Science,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. Transparent Electronics

2. Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors

3. Characteristics of ZnO Thin Films by Means of Plasma-Enhanced Atomic Layer Deposition

4. The physics of amorphous-silicon thin-film transistors

5. Physics of amorphous silicon based alloy field‐effect transistors

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4. High‐Performance Full‐Solution‐Processed Oxide Thin‐Film Transistor Arrays Fabricated by Ultrafast Scanning Diode Laser;Advanced Materials Interfaces;2022-08-19

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