Residual lifetime prediction model of nonlinear accelerated degradation data with measurement error
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Institute of Electrical and Electronics Engineers (IEEE)
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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5. Remaining useful lifetime prediction for equipment based on nonlinear implicit degradation modeling;Journal of Systems Engineering and Electronics;2020-01-31
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