Abstract
We report a new thermal atomic layer deposition (thermal-ALD) process including an air exposure as a third precursor to deposit crystalline TiO2 anatase thin films from tetrakis(dimethylamido)titanium(IV) (TDMAT) and water at deposition temperatures as low as 180 °C and film thicknesses as low as 10 nm. This ALD process enables TiO2-antase crystal growth during the deposition at low temperatures (< 220 °C). This additional oxidant pulse is used to fully oxidize the Ti to a 4+ state in the amorphous film, lowering the barrier to crystalline anatase formation. This new approach is informed by preliminary studies of post-deposition annealing (PDA) of thermal ALD films in both nitrogen and air atmospheres, which demonstrate the importance of having an oxidizing atmosphere to achieve the nucleation of the crystalline anatase phase. This oxidizing atmosphere is subsequently introduced into the ALD cycle as a third precursor and is shown to be more effective and efficient in promoting the crystalline transformation than even by post-deposition annealing. The crystalline anatase phase is verified by Raman spectroscopy and grazing incidence X-ray diffraction (GIXRD). The mechanism for crystallization during the TDMAT/H2O/air ALD cycle is probed by chemical state analysis via X-ray photoelectron spectroscopy (XPS). We propose that sub-oxidation in TiO2 thin films deposited by the thermal-ALD process inhibits crystallization during ALD from TDMAT/H2O chemistry. Scanning electron microscopy (SEM) is used to investigate the microstructure of these TiO2 thin films as a function of thickness (5 nm to 50 nm) and deposition temperature (180 °C to 220 °C). The reported layer-by-layer air anneal process is found to crystallize entire films in shorter total process times than thermal-ALD with ex situ post deposition annealing at identical temperatures, presumably due to the improved surface diffusion kinetics accessed during the deposition process.