Sensitivity Improvement and Stabilization For Ultra Light Element Analysis by X-Ray Spectrometry

Abstract

Many light and ultra-light element analysis problems have been addressed by X-ray fluorescence. Recent innovative features of X-ray spectrometers have extended the applicability of X-ray fluorescence to ultra-light element analysis. Sensitivities have improved through the use of a newly developed end window X-ray tube. Selection of analyzing optics conditions optimize to some degree the sensitivity/resolution/intensity problems. Instrument stability is greatly improved by simply monitoring and controlling the vacuum within the analyzing chamber. Data are presented to illustrate the effects of these novel instrument components as well as describing several new application techniques for ultra-light element analysis.