X-Ray Fluorescence Analysis for Sodium, Fluorine, Oxygen, Nitrogen, Carbon, and Boron*

Author:

Henke Burton L.

Abstract

AbstractOptimized vacuum spectrographic measurement of low-energy fluorescence has been found to yield counting rates and peak-to-background ratios which are enough to permit the extension of fluorescence analysis for elementary chemistry into the light-element range—sodium through boron. This is accomplished with an efficient, demountable ultrasoft X-ray source, with close coupling among source, crystal, and detector, with KAP and multilayered stearate analyzers, and with, optimized flow-propordonal counting. Specific methods for achieving peak-to-background ratios on practical samples containing these light elements are presented. The extension of these methods of light-element analysis with the use of curved long-spaced crystals for X-Ray macroprobe and electron microprobe measurements is discussed. The design and construction of multilayered soap film “crystals” for long-wavelength X-ray analysis is described.

Publisher

Cambridge University Press (CUP)

Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. CRYSTAL OPTICS;Vacuum Ultraviolet Spectroscopy;2000

2. Sensitivity Improvement and Stabilization For Ultra Light Element Analysis by X-Ray Spectrometry;Advances in X-ray Analysis;1993

3. Properties of curved x‐ray diffractors with stepped surfaces;Journal of Applied Physics;1991-04

4. Nanotechnology;Journal of Physics E: Scientific Instruments;1987-12

5. Determination of Oxygen and Nitrogen in Various Materials by X-Ray Fluorescence Spectrometry;Advances in X-Ray Analysis;1984

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