Application of X-Ray Fluorescence Analysis to Process Control

Author:

Bernstein F.

Abstract

AbstractThe application of X-ray fluorescence-analysis methods to process control is discussed. Various methods of sample preparation are reviewed and compared. The use of the direct sampling technique is discussed and consideration is given to the effects of particle size on precision and accuracy of analytical results. The mechanism of these effects if presented, and some general principles concerning the relationship of fluorescent intensities and particle sizes of pure materials and mixtures are derived. Examples of particle-size effects in cement and mining applications are illustrated.

Publisher

Cambridge University Press (CUP)

Reference9 articles.

1. Kester B. E. , AIEE Cement Industry Conference, May, 1960.

2. X-Ray Spectrographic Determination of Cesium and Rubidium

3. Wood R. E. and Bingham E. R. , Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, February, 1961.

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1. X-ray spectrometry;Metallurgical Reviews;1971-01

2. Light Element Analysis;Advances in X-Ray Analysis;1970

3. On-Line Type X-Ray Emission Analyzer Systems;Advances in X-Ray Analysis;1962

4. On-Line Type X-Ray Emission Analyzer Systems;Advances in X-ray Analysis;1961

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